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北京 – 2014年10月24日
上海－2014年10月28日
在材料表征方面有30多年經(jīng)驗的美國埃文思分析集團（EAG），現(xiàn)邀請您參加我們于2014年10月24日在北京和10月28日在上海舉辦的材料分析技術(shù)研討會。與以往不同的是，會議將討論目前主流的材料的分析方法，并提供分析案例。分享內(nèi)容將全面覆蓋以往分開舉辦的SIMS與GDMS等相關(guān)技術(shù)研討會。
對于想了解相關(guān)材料分析技術(shù)，以及在材料認(rèn)證、工藝控制和良率提升方面如何最有效的應(yīng)用這些技術(shù)的您來說，這是一個絕好的機會。
| 會場 A | 會場 B | ||
| 8:45 – 09:15 | 簽到注冊 | 簽到注冊 | 8:45 – 09:15 |
| 9:15 – 9:45 | 公司介紹 | 公司介紹 | 9:15 – 9:45 |
| 9:45 – 10:15 | 二次離子質(zhì)譜(SIMS)-原理 二次離子質(zhì)譜 |
當(dāng)代前沿科技對新材料的需求及挑戰(zhàn) | 9:45 – 10:15 |
| 10:15 – 10:45 | 茶歇 | 茶歇 | 10:15 – 10:45 |
| 10:45 – 11:30 | 二次離子質(zhì)譜(SIMS)-應(yīng)用 | 輝光放電質(zhì)譜 GDMS | 10:45 – 11:30 |
| 11:30 – 12:00 | XPS X射線光電子能譜 |
氣體分析IGA 熱分析技術(shù)-熱重/熱差/差示掃描熱量TGA/DTA/DSC |
11:30 – 12:15 |
| 12:00 – 13:30 | 午餐 | 午餐 | 12:15 – 13:45 |
| 13:30 – 14:00 | AES 俄歇電子能譜 |
電感耦合等離子質(zhì)及光譜 ICP-MS and ICP-OES |
13:45 – 14:15 |
| 14:00 – 14:45 | TEM 透射電子顯微鏡 |
材料純度分析：濕法分析（ICP）和固體直接取樣分析（GDMS）的優(yōu)缺點比較 | 14:15 – 14:45 |
| 14:45 – 15:15 | 茶歇 | 茶歇 | 14:45 – 15:15 |
| 15:15 – 15:45 | RBS 盧瑟福背散射 |
實現(xiàn)高性能合金品質(zhì)可靠性及一致性生產(chǎn) | 15:15 – 15:45 |
| 15:45 – 16:15 | TOF-SIMS 飛行時間二次離子質(zhì)譜 |
案例分析 高純硅 石墨 碳化硅 及 氧化鋁 |
15:45 – 16:15 |
| 16:15 – 17:00 | 總結(jié)/問答 | 總結(jié)/問答 | 16:15 – 17:00 |
關(guān)于EAG:
埃文思分析集團（EAG）是材料分析行業(yè)的全球領(lǐng)導(dǎo)者，在材料表面及本體結(jié)構(gòu)組成表征分析服務(wù)方面有30多年的專業(yè)經(jīng)驗。, 我們與半導(dǎo)體、航空航天、通訊、激光/光學(xué)、數(shù)據(jù)存儲，生物醫(yī)療設(shè)備及器件、汽車和新能源等多個行業(yè)進行緊密合作，為各行業(yè)合作伙伴們涉及研發(fā)、生產(chǎn)支持、失效分析、產(chǎn)品質(zhì)量認(rèn)證及供應(yīng)鏈體系質(zhì)量控制等各環(huán)節(jié)提供一流質(zhì)量的、高效的材料表征分析服務(wù)。
EAG在全球共設(shè)有11個實驗室和服務(wù)中心。我們提供29種自有分析技術(shù)服務(wù)包括SIMS, GDMS, Quad SIMS, TOF-SIMS, ICP-MS/OES, XPS, AES, FTIR, SEM/EDS, FIB, TXRF, AFM/SPM, RBS, HFS, PIXE, XRF, Raman, 和GC/MS 以及符合要求的合作方提供的分析服務(wù)。依靠充足的設(shè)備資源以及先進的分析技術(shù)我們可以提供快速的分析周期、更高的數(shù)據(jù)質(zhì)量、完美的檢測限，以及一站式全面分析服務(wù)。
報告人簡介:
Larry Wang
Vice President and Scientific Fellow of SIMS Services at Evans Analytical Group. Dr. Wang is responsible for the operation of SIMS analytical services, and for technical developments on SIMS analysis of new materials and new structures. Dr. Wang joined Charles Evans & Associates, now Evans Analytical Group, in 1994. Dr. Wang has over 20 years experience with a variety of analytical techniques for material analysis.
Karol Putyera
Vice President, GDMS Analytical Services, New York. Dr. Putyera started to work for Shiva Technologies, Inc. in 1992 as a part-time GDMS analyst while being a Research Associate in the L.C. Smith College of Chemical Engineering and Materials Science at Syracuse University NY, from 1992-1995. Dr. Putyera completed his BS and M.S. degrees in Physical Chemistry at Charles University, Prague, Czech Republic in 1983 and 1985, respectively. He received his Ph.D. degree in Inorganic Chemistry in 1991 at the Institute of Inorganic Chemistry, Slovak Academy of Sciences, Slovak Republic.
Patrick Schnabel
Dr. Schnabel is the Director of Quality and Manager of the RBS, Auger and TXRF lab at EAG. He is responsible for the Quality Assurance Program at EAG and for the operation of RBS, Auger and TXRF analytical services. Dr. Schnabel joined EAG in 1997. Prior to working at EAG he was a Laboratory Manager at Degussa Corporation in Germany. Dr. Schnabel has more than 20 years’ experience in surface analysis and materials characterization. He has a Ph.D. in Chemical Engineering from the Technical University Darmstadt, Germany.
Jackey He
Mr. He is the Technical Director of Evans Analytical Group (China), responsible for surface analysis laboratory operations, sales and marketing. He joined Advanced Materials Engineering Research, Inc. (AMER) since 2005, and successfully launched AMER China, Inc. in Shanghai during 2005. Mr. He joined Evans Analytical Group (EAG) with the acquisition of AMER China in Dec., 2006. Prior to his current position he was a Technical Manager with Shanghai Yes Semiconductor Ltd, responsible for failure analysis.
Xinwei Wang
Manager of New Development and Project at Evans Analytical Group - New York. Dr. Wang joined EAG in 2009 in charging of developing thermal analysis services and later helping developing other bulk elemental analysis techniques (ICP-MS/OES, GDMS and IGA). Prior to joining EAG, he worked as a postdoc in energy storage materials, hydrogen fuel cells and batteries. Dr. Wang completed his PhD in Chemistry from State University of New York – Environmental Sciences and Forestry and Syracuse University in 2005.
Andrew Su
Team Leader, Element GD & Astrum Group. Mr. Su joined Shiva Technologies, Inc., EAG-NY’s predecessor company in 2005 as a staff analyst first specializing on inorganic gas analyzers (IGA) later on advanced materials characterization using high resolution glow-discharge mass spectrometry techniques (GDMS). Recently his main focus is on method developments for high resolution GDMS instruments equipped with fast-flow glow-discharge ion source. Mr. Su received M.S. in Chemical Engineering from Syracuse University, Syracuse, NY, USA in 2005 and B.S. from National Taipei University of Technology, Taiwan in 1998.
Fangfang Mao
Dr. Mao is the TEM scientist of Evans Analytical Group (China), responsible for TEM technique at EAG-China. Dr. Mao joined Evans Analytical Group (EAG) in 2013. Prior to his current position she was a TEM researcher as a Ph.D. in Shanghai Institute of Ceramics, CAS.
Nickey Liu
Mr. Liu is the GDMS Manager of Evans Analytical Group (China), responsible for GDMS technique at EAG-China. Mr. Liu joined Evans Analytical Group (EAG) in 2008. Prior to his current position he was an IC design manager with Shanghai Aopen Ltd, responsible for PC motherboard design.
會議注冊:
參會需要提前注冊. 請點擊下面的鏈接在線注冊或聯(lián)系我們的工作人員:
Ying Zhou: ying.zhou@eag.com
REGISTER 北京研討會
星期三, 2014年10月24日
清華紫光國際交流中心
北京海淀區(qū)中關(guān)村東路1號10號樓
電話: 010-62791888
REGISTER 上海研討會
星期五, 2014年10月28日
上海帝盛酒店
浦東新區(qū)花木路800號
電話: 021-35822222
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